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Connect ATE instrumentation to interface test adapter.


Showing results: 256 - 270 of 292 items found.

  • Probing Solutions

    ES62X-CMPS - ESDEMC Technology LLC

    The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.

  • Powerful In-Circuit Production Flash Programmer

    CYCLONE FX - P&E Microcomputer Systems

    P&E Microcomputer Systems' Cyclone FX programmer is is a powerful in-circuit, stand-alone programmer that supports a wide range of ARM Cortex and NXP® processor families. It's a versatile tool that offers on-board storage of programming images, provides power to the target, supports manual or automated programming, and has an easy-to-use touchscreen interface. Programming may be launched by a single button press without a PC or automatically from a PC via the automated control SDK. The Cyclone may also be used as a debug probe during development.

  • Coating Thickness Gauge for Ferrous and Non-Ferrous Materials

    CM8856 - Rinch Industrial Co.,Limited

    * It meets the standards of both ISO2178 and ISO 2361 as well as DIN, ASTM and BS. It can be used both in the laboratory and in harsh field conditions.* The F probes measure the thickness of non-magnetic materials (e.g. paint,plastic, porcelain enamel, copper, zinc,aluminum , chrome etc.) on magnetic materials (e.g. iron, nickel etc.) . often used to measure the thickness ofgalvanizing layer, lacquer layer, porcelain enamel layer, phosphide layer, copper tile, aluminum tile, somealloy tile, paper etc.The N probes measure the thickness of non - magnetic coatings on non-magnetic metals .It is used on anodizing, varnish, paint, enamel,plastic coatings, powder, etc. appliedto aluminum, brass, non-magnetic stainless steel, etc.* Automatic substrate recognition.* Manual or automatic shut down.* Two measurement mode: Single andContinuous* Wide measuring range and highresolution.* Metric/Imperial conversion.* Digital backlit display gives exactreading with no guessing or errors.* Can communicate with PC computerfor statistics and printing by theoptional cable.* Can store 99 groups of measurements.* Statistics is available.2.SPECIFICATIONSDisplay: 4 digits LCD, backlitRange: 0~1250 μm/0~50mil(other ranges can be specified )Min.radius workpiece: F: Convex 1.5mm/Concave 25mmN: Convex 3mm/ Concave 50mmMin. measuring area: 6mmMin.Sample thickness : 0.3mmResolution: 0.1 μm (0~99.9μm);1 μm (over 100μm)Accuracy: ±1~3%n or 2.5 μm or 0.1mil(Whichever is the greater)Bttery Indicator: Low batter indicator.PC interface: with RS-232C interfacePower supply: 2x1.5 AAA(UM-4) batteryOperating condition: Temp. 0~50℃ .Humidity <95% .Size: 126x65x35 mm; 5.0x2.6x1.6 inchWeight: about 81g(not including batteries)Standard accessories:Carrying case ...................1 pc.Operation manual ............ 1 pc.F probe in built .................1 pc.NF probe in built...............1 pc.Calibration foils ..............1set.Substrate (Iron) ................1 pc.Substrate (Aluminium)......1 pc.Optional accessories: RS-232C cable & software:1.USB adaptor for RS-232C2.Bluetooth interface

  • Coating Thickness Gauge

    CM8855 - Rinch Industrial Co.,Limited

    It meets the standards of both ISO2178 and ISO 2361 as well as DIN, ASTMand BS. It can be used both in the laboratory and in harsh field conditions. The F probes measure the thickness of non-magnetic materials (e.g. paint,plastic, porcelain enamel, copper, zinc, aluminum , chrome etc.) on magneticmaterials (e.g. iron, nickel etc.) . often used to measure the thickness ofgalvanizing layer, lacquer layer,porcelain enamel layer, phosphidelayer, copper tile, aluminum tile, some alloy tile, paper etc. The N probes measure the thickness of non - magnetic coatings on non-magnetic metals .It is used on anodizing, varnish, paint, enamel,plastic coatings, powder, etc. appliedto aluminum, brass, non-magnetic stainless steel, etc. Automatic substrate recognition. Manual or automatic shut down. Two measurement mode: Single and Continuous Wide measuring range and high resolution. Metric/Imperial conversion. Digital backlit display gives exact reading with no guessing or errors. Can communicate with PC computer for statistics and printing by the optional cable. Can store 99 groups of measurements. Statistics is available.2.SPECIFICATIONSDisplay: 4 digits LCD, backlitRange: 0~1250 μm/0~50mil (other ranges can be specified )Min.radius workpiece: F: Convex 1.5mm/Concave 25mmN: Convex 3mm/ Concave 50mmMin. measuring area: 6mmMin.Sample thickness : 0.3mmResolution: 0.1 μm (0~99.9μm);1 μm (over 100μm)Accuracy: ±1~3%n or 2.5 μm or 0.1mil(Whichever is the greater)Bttery Indicator: Low batter indicator.PC interface: with RS-232C interfacePower supply: 2x1.5 AAA(UM-4) batteryOperating condition: Temp. 0~50℃ .Humidity <95% .Size: 126x65x35 mm; 5.0x2.6x1.6 inchWeight: about 81g(not including batteries)Standard accessories:Carrying case ...................1 pc.Operation manual ............ 1 pc.F probe in built .................1 pc.NF probe in built...............1 pc.Calibration foils ..............1set.Substrate (Iron) ................1 pc.Substrate (Aluminium)......1 pc.Optional accessories: RS-232C cable & software:1.USB adaptor for RS-232C2.Bluetooth interface

  • Power Meters

    Rk-5700 - Laser Probe Inc.

    The Rk-5700 Series Power Meters accept a wide variety of probes – pyroelectric, silicon, and thermopile – enabling them to perform absolute radiometry, total laser power (cw and average), and irradiance measurements from the UV to far-IR, pW to kW. Integrated lock-in amplifier circuitry allows for synchronous detection of chopped optical signals, improving both S/N ratio and background rejection. The dual channel Rk-5720 simultaneously measures Channel A, Channel B, and the ratio B/A. An IEEE-488 GPIB computer interface, Analog Outputs, Background Cancel, and Autorange are all standard features.

  • pH/ORP/Temperature Datalogger

    Extech SDL100 - Extech Instruments Corporation

    - Dual display of pH or mV and Temperature- ATC or manual Temperature compensation- 3 point calibration ensures the best linearity and accuracy- Large backlit dual LCD- Stores 99 readings manually and 20M readings via 2G SD card- User programmable sampling rate- Built-in PC interface- Min/Max and Data Hold functions, Auto power off- Complete with 6 x AA batteries, SD card, hard carrying case, sample buffers, mini pH electrode (60120B), and Thermistor temperature probe (850188)

  • USB Oscilloscope

    Handyscope HS6 DIFF - TiePie engineering

    This powerful USB 3.0 super speed oscilloscope combines fast sampling up to 1 GS/s with high resolutions of 12, 14 and 16 bit and a large memory of 64 MSamples on all four channels. The oscilloscope supports continuous streaming measurements up to 200 MS/s and can be synchronized with other oscilloscopes using the CMI interface to form a multi channel combined instrument with synchronized timebase. The CMI interface is available by default on the Handyscope HS6 DIFF. Optionally, the Handyscope HS6 DIFF can be delivered with SureConnect connection test and resistance measurement on each channel. Also, the Handyscope HS6 DIFF can be delivered with SafeGround option. With SafeGround you can switch the differential inputs of the Handyscope HS6 DIFF into single ended inputs with ground protection. It allows to make measurements using standard attenuating probes and protects the scope when a short circuit to ground is created.

  • Circuit Breaker Timer Kit

    CBT-Eco - Neutronics Manufacturing Co.

    *Input Supply: 230 V ± 10 %, AC, 50 Hz, 1 Phase (Ground must).*Display: 16 X 2 Big size LCD display with backlight.*Accuracy : Class 0.5*Resolution: 1 milli second*Count: 1 to 9999 milli second*Operation: Accurate Measurement for Close and Trip Command for BreakersThrough Trip-Free Operation C-O-C timing can be measure accurately.Up to 99 No. of Bounces for Close Operation on all three Pole can be count.(Model: CBT CP)Measure timing up to 7 numbers of Bounces on all pole.(Model: CBT CP)Reset for Next Measurement.Indicate the Status of Pole (Close /Open) during start of Test on LCD Display.*Front Panel : Operation Guide Sticker Plate, and Connectors. .(with Printer on Model: CBT CP*)Housing : Aluminum Carrying Case Enclosure.*Accessories : Mains Power Cable, Probe set of 5 MTR long, computer Interface cable for connecting with PC or Laptop and Bag. (Optional), User’s Manual and Test Report.*AVAILABLE MODEL:· Model: CBT CP, with PC Interface and software.· Model: CBT P, without PC Interface and without Software.

  • Coating Thickness Gauge

    Dalian Taijia Technology Co.,Ltd

    In built probe(s)● Operating principle: magnetic induction/eddy current (F/NF)● Measuring range:0-1250um/0-50mil● Resolution; 0.1/1● Accuracy: ±1-3%n or ±2.5um● Min. measuring area: 6mm● Min. sample thickness: 0.3mm● Battery indicator: low battery indicator● Metric/ imperial: convertible● Power supply: 4x1.5V AAA(UM-4)battery● Auto power off● Operating conditions:0-+45℃(32℉-104℉),≤90%RH● Dimensions: 126x65x27mm● Weight: 81g(not including battery)● Optional accessories:● other range 0-200um to 15000um● RS-232C cable & software: 1.USB adaptor for RS-232C 2.Bluetooth interface

  • Combination Board Tester

    Qmax Test Technologies Pvt. Ltd.

    Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.

  • Dual Laser InfraRed Thermometer - Wide Range IR Thermometer with Type K Input and USB interface

    Extech 42570 - Extech Instruments Corporation

    This Dual Laser Infrared Thermometer identifies the IR temperature where the dual laser converges into a single spot at approximately 50 inches from the target. Meter features fast 100 millisecond response times, Type K input, and a USB interface. Adjustable emissivity increases measurement accuracy for a variety of surfaces. Adjustable high/low set points with audible alarm alerts you when the temperature exceeds programmed set points. Featuring MAX/MIN/AVG/DIF measurements that displays the highest, lowest, average, and MAX minus MIN values. Comes complete with Type K temperature probe, USB cable and software, carrying case and 9-volt battery.

  • Combination Board Tester

    V250 / V250PXI - Qmax Test Technologies Pvt. Ltd.

    V250 / V250PXI is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.

  • Boundary-Scan Interactive Analyzer & Toolkit

    ScanExpress JTAG Debugger - Corelis, Inc.

    Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.

  • Electrical Troubleshooting Kit

    Extech MG302-ETK - Extech Instruments Corporation

    Test and measurement kit for electrical installation, troubleshooting, and repair.Kit includes:MG302 - True RMS Multimeter/Insulation Tester with 13 Functions and Wireless PC Interface.42509 - 12:1 Infrared Thermometer with high/low alarm and fast 2-color display.MA430T - 400A True RMS AC Clamp Meter with built-in non-contact voltage detector.Complete with with test leads, Type K thermocouple bead wire probe, batteries, and hard storage case that provides protection and organization for the meters and accessories

  • Benchtop Discrete Component Tester

    Imapact 7BT - Lorlin Test Systems

    The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.

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